Advanced plasma debris mitigation, Advanced tin and lithium fuels research, optics contamination, erosion and lifetime research, self-healing optics research, halide etching and condensable material removal, fast ion suppression with light gas mixtures
Starfire Industries LLC
EDUCATION:
B.S. Aeronautical and Astronautical Engineering Univ. of Illinois, Urbana 1995
M.S. Nuclear Engineering Univ. of Illinois, Urbana 1997
MBA Technology Commercialization Univ. of Illinois, Urbana 2000
Ph.D. Nuclear, Plasma, and Radiological Engineering Univ. of Illinois 2001
ACADEMIC POSITIONS HELD:
Adjunct Ressearch Assistant Professor, February 2007 - present
Research Engineer, University of Illinois at Urbana-Champaign, 2004-2005
Post-Doctoral Research Associate, University of Illinois at Urbana-Champaign, 2003
PUBLICATIONS:ARTICLES IN JOURNALS — past five years
Jurczyk, B.E., M. Vargas-Lopez, N. Neumann, D.N. Ruzic, "Illinois Debris-mitigation EUV Applications Laboratory (IDEAL)", Microelectronics Engineering 77 (2005) 103-109.
Vargas-Lopez, E., B.E. Jurczyk, M. A. Jaworski, M. J. Neumann, D. N. Ruzic, "Origins of debris and mitigation through a secondary RF plasma system for discharge-produced EUV sources", Microelectronics Engineering 77 (2005) 95-102.
Thompson, K.C., E. L. Antonsen, M.R. Hendricks, B.E. Jurczyk, M. Williams, D. N. Ruzic, "Experimental test chamber design for optics exposure testing and debris characterization of a xenon discharge produced plasma source for extreme ultraviolet lithography", Microelectronics Engineering, 83 (2006) 476-484.
Antonsen, E.L., K.C. Thompson, M. R. Hendricks, D. A. Alman, B.E. Jurczyk, D.N. Ruzic, "Ion Debris Characterization form a Z-Pinch Extreme Ultraviolet Light Source", J. Appl.Phys., 99 063301 (2006)
Jaworski, M.A., B.E. Jurczyk, E.L. Antonsen, D.N. Ruzic, "Direct current magnetic insulation of an immersed RF antenna", Plasma Source Science and Technology 15, 474-478 (2006)
Qiu, H., D.A. Alman, K.C. Thompson, J.B. Spencer, E.L. Antonsen, B.E. Jurczyk, D.N. Ruzic, T.P. Spila, "Characterization of collector optic material samples before and after exposure in laser produced plasma and discharge produced plasma EUV sources", accepted in J. Microlithography, Microfabrication, and Microsystems, 2006
Alman, D.A., H. Qiu, T. Spila, K.C. Thompson, E.L. Antonsen, B.E. Jurczyk, D.N. Ruzic, "Characterization of collector optic material samples exposed to a DPP EUV light source", accepted in J. Microlithography, Microfabrication, and Microsystems, 2006.
ARTICLES IN CONFERENCE PROCEEDINGS — past five years
Plasma-Based Techniques to Reduce Particle Contamination, 30th SPIE Microlithography Conferences, San Jose CA, March 2005
Progress toward Sn DPP and LPP Solution: a Source-Collector perspective, 5th International Symposium on EUV Lithography, San Diego, CA, Nov. 2005
Cleaning of Condensable Fuels from EUV Optics, 5th International Symposium on EUV Lithography, San Diego, CA Nov. 2005
Debris Characterization and Collector Material Lifetime for a Commercial Tin-based Z-pinch Extreme Ultraviolet Light Source, 5th International Symposium on EUV Lithography, San Diego, CA, Nov. 2005